Nondestructive concentration depth profiling by XPS.

Nondestructive determination of the surface concentration gradients at solid surfaces modified by ion and laser beams using angle resolved photoelectron spectroscopy and lineshape analysis, scattering of electrons in solids.
Organizators

RNDr. BASTL Zdeněk CSc.

Room
234, 207, 204
Extension
3526, 3466, 3456
E-mail
zdenek.bastl@jh-inst.cas.cz